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<xml><bibliography><APA>Palaporn Kanjanasirirut และ Kamol Pataradool; Sumonmal Manusirivithaya; Chadakarn Phaloprakarn; Chutima Chavanisakun. (2015) Prevalence  and  Risk  Factors  for  Positive  Surgical  Margin  after  Loop  Electrosurgical  Excision  Procedure  (LEEP)  in  Patients with High Grade Squamous Intraepithelial Lesion. &lt;i&gt;Thai Journal of Obstetrics and Gynaecology&lt;/i&gt;, &lt;i&gt;23&lt;/i&gt;(4), 240-245.</APA><Chicago>Palaporn Kanjanasirirut และ Kamol Pataradool; Sumonmal Manusirivithaya; Chadakarn Phaloprakarn; Chutima Chavanisakun. "Prevalence  and  Risk  Factors  for  Positive  Surgical  Margin  after  Loop  Electrosurgical  Excision  Procedure  (LEEP)  in  Patients with High Grade Squamous Intraepithelial Lesion". Thai Journal of Obstetrics and Gynaecology  23 (2015):240-245.</Chicago><MLA>Palaporn Kanjanasirirut และ Kamol Pataradool; Sumonmal Manusirivithaya; Chadakarn Phaloprakarn; Chutima Chavanisakun. Prevalence  and  Risk  Factors  for  Positive  Surgical  Margin  after  Loop  Electrosurgical  Excision  Procedure  (LEEP)  in  Patients with High Grade Squamous Intraepithelial Lesion. PIMDEE Co. Ltd.:ม.ป.ท. 2015.</MLA></bibliography></xml>
