Margareta Pecovska-Gjorgjevich และผู้แต่งคนอื่นๆ. (2012) Behavior of Ta2 O5 -Si Capacitors with Different Gate Electrode under Constant Current Stress. <i>Silpakorn University Science and Technology Journal</i>, <i>6</i>(2), 37-48.Margareta Pecovska-Gjorgjevich และผู้แต่งคนอื่นๆ. "Behavior of Ta2 O5 -Si Capacitors with Different Gate Electrode under Constant Current Stress". Silpakorn University Science and Technology Journal 6 (2012):37-48.Margareta Pecovska-Gjorgjevich และผู้แต่งคนอื่นๆ. Behavior of Ta2 O5 -Si Capacitors with Different Gate Electrode under Constant Current Stress. Silpakorn University Research and Development Institute:ม.ป.ท. 2012.