<?xml version="1.0" encoding="UTF-8"?>
<xml><bibliography><APA>Saowanit Sukparungsee. (2018) An approximation of average run length using the Markov chain approach of a generally weighted moving average chart to monitor the number of defects. &lt;i&gt;Songklanakarin Journal of Science and Technology&lt;/i&gt;, &lt;i&gt;40&lt;/i&gt;(6), 1368-1377.</APA><Chicago>Saowanit Sukparungsee. "An approximation of average run length using the Markov chain approach of a generally weighted moving average chart to monitor the number of defects". Songklanakarin Journal of Science and Technology  40 (2018):1368-1377.</Chicago><MLA>Saowanit Sukparungsee. An approximation of average run length using the Markov chain approach of a generally weighted moving average chart to monitor the number of defects. Research and Development Office, Prince of Songkla University:ม.ป.ท. 2018.</MLA></bibliography></xml>
